Some Recent Publications
Hahn, G.J. and Meeker, W.Q. (1993) The Assumptions of
Statistical Inference. The American Statistician 47, 1-11.
Lu, C.J., and Meeker, W.Q. (1993), Using Degradation Measures to
Estimate a Time-to-Failure Distribution. Technometrics 35,
Meeker, W. Q., and Escobar, L. A. (1993), A Review of Recent
Research and Current Issues in Accelerated Testing.
International Statistical Review 61, 147-168.
Arnold, B. C., Beaver, R. J., Groeneveld, R. A., and Meeker, W. Q.
(1993), The Nontruncated Marginal of a Truncated Bivariate Normal
Distribution, Psychometrika 58, 471-488.
Meeker, W. Q., and Escobar, L. A. (1994), An Algorithm to Compute the
cdf of the Product of Two Normal Random Variables, Communications
in Statistics 23, 271-280.
Meeter, C.A., and Meeker, W.Q. (1994), Optimum Accelerated Life Tests
with Nonconstant Scale Parameter. Technometrics 36, 71-83.
Escobar, L. A., and Meeker, W. Q. (1994), Fisher Information Matrix
for the Extreme Value, Normal, and Logistic Distributions and Censored
Data , Applied Statistics, 43, 533-540.
Olin, B. D. and Meeker, W. Q., (1994), Applications of Experimental
Design in Nondestructive Evaluation, In Thompson, D. O. and Chimenti,
D. E, editors, Review of Progress in Quantitative Nondestructive
Evaluation 13, 2199-2206. Plenum Press.
Garrigoux, C. G. and Meeker, W. Q. (1994), A Reliability Model for
Planning In-Service Inspections for Components Subject to Degradation
Failure, Pakistan Journal of Statistics, 10 79-98.
Meeker, W. Q., and Escobar, L. A. (1994), Maximum Likelihood Methods
for Fitting Parametric Statistical Models to Censored and Truncated
Data. In Probabilistic and Statistical Methods in the
Physical Sciences, edited by John Stanford and Stephen Vardeman, New
York: Academic Press.
Garrigoux, C. G. and Meeker, W. Q. (1995), Assessing the Effect of
In-Service Inspections on the Reliability of Degrading Components,
Recent Advances in Life-Testing and Reliability, N. Balakrishnan
(Editor), CRC Press.
Meeker, W. Q., and LuValle, M. J. (1995), An Accelerated Life Test
Model Based on Reliability Kinetics. Technometrics 37,
Meeker, W. Q. and Escobar, L. A. (1995), Teaching About Approximate
Confidence Regions Based on Maximum Likelihood Estimation, The
American Statistician 49, 48-53.
Meeker, W. Q. and Hamada, M. (1995), Statistical Tools for the Rapid
Development &Evaluation of High-Reliability Products, IEEE
Transactions on Reliability R-44, 187-198.
Moore, D. S., Cobb, G. W., Garfield, J., and Meeker, W. Q. (1995),
Statistics Education Fin de Siècle, The American
Statistician 49, 250-260.
Escobar, L. A., and Meeker, W. Q. (1995), Planning Accelerated Life
Tests with Two or More Factors. Technometrics 37, 411-427.
Olin, B. D. and Meeker, W. Q., (1996), Applications of Statistics in
Nondestructive Evaluation. (with discussion) Technometrics 38,
Cannon, A. R. and Meeker, W. Q. (1996), Statistical Tests for Signals
in Categorical Temporal Data. Biometrical Journal 38, 39-59.
Lu, C. J., Meeker, W. Q., and Escobar, L. A. (1996), A Comparison of
Degradation and Failure-Time Analysis Methods of Estimating a
Time-to-Failure Distribution. Statistica Sinica 6,
Marasinghe, M., Meeker, W., Cook, D., and Shin, T. (1996), Using
Graphics and Simulation to Teach Statistical Concepts.
The American Statistician, 50 xxx-xxx (in press).
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