Statistics 533 - Reliability

Spring 2000

Instructor: William Q. Meeker,
304C Snedecor Hall, 515-294-5336; FAX: 515-294-4040

Instructor email: wqmeeker@iastate.edu

Office hours: MTWRF 1:10-2:00 p.m. or by appointment

Lecture: TR 3:40-5:00, Room: TBA

Statistics 533 homepage:
http://www.public.iastate.edu/~stat533

Text: *
Statistical Methods for Reliability Data * ,
by W.Q. Meeker and L.A. Escobar (1998), John Wiley and Sons, Inc..

A few typos and other errors have been discovered in the book. The current list can accesed by clicking here. If you think that you have found a new typo, please send email to wqmeeker@iastate.edu . I pay $1 reward for each confirmed newly-discovered typo or error reported!

Tentative Outline

Chapter 1: Reliability Concepts and Reliability Data (1.5 hours)

Chapter 2: Models, Censoring, and Likelihood for Time-to-Failure Data
(1.5 hours)

Chapter 3: Nonparametric Estimation (4 hours)

Chapters 4 and 5: Failure-time Distributions (1 hour)

Chapter 6: Probability Plotting and Choosing a Failure-Time Distribution
(3 hours)

Chapter 7: Parametric Likelihood Concepts: Exponential Distribution
(2 hours)

Chapter 8: Maximum Likelihood: Log-location-Scale Based Distributions (3
hours)

Chapter 9: Simulation-based (Bootstrap) Methods for Obtaining Confidence
Intervals (1.5 hours)

Chapter 10: Planning Studies to Obtain
Reliability Data (1.5 hours)

Chapter 11: Other Parametric Models (1 hour)

Chapter 15: System Reliability Concepts; Data with Multiple Failure Modes
(3 hours)

Chapter 17: Failure-Time Regression Analysis (3 hours)

Chapter 18: Accelerated Test Models (2 hours)

Chapter 19: Analyzing Accelerated Life Test Data (3
hours)

Chapter 20: Planning Accelerated Life Tests (1 hour)

Chapter 14: Bayesian Methods for Analyzing Reliability Data (2
hours)

Chapter 16: Analysis of Repairable System and other Recurrence
Data (2 hours)

Prerequisite: Statistics 231, 401 or 500 (basic concepts of statistical
methods)
and Statistics 342 or 432 or 447 (calculus-based elementary theory of
probability and statistics).