Experimental methods for optical properties of solids

• Spectroscopic Rotating Analyzer Ellipsometer(RAE) is an experimental equipment to measure optical properties of materials ( dielectric constants, reflective index, optical conductivity ). It measures the difference between linearly polarized light (s p polarization ) and very useful tool to get optical properties and thin film analysis ( Thickness of oxide layer ). We have 2 home made ellipsometry instruments.

• Magneto-Optic Kerr Spectrometer(MOKE) is measuring Kerr effect (Kerr rotaion and Kerr ellipticity).

• AES (Auger electron spectroscopy) and LEED to check the surface of  materials.

• X-ray Powder Diffractometer to check the sample's lattice constants and crystal structure.
  • using software PCW 2.3 (Powder cell), GSAS

• Thin film evaporator in UHV.
  　

Solid State Band Calculation Programs

• TB-LMTO Ver41 compiled local IBM PC compiled with MS fortran ported from LMTO 41 unix machine with spin-orbit.
  • Band structure,
  • Density of state (DOS),
  • Optical conductivity,
  • Kerr angle, Kerr ellipticity

• TB-LMTO Ver42 locally modified (with Spin-Orbit coupling) runs in Linux f77.

• TB-LMTO ASA Ver47 (Tight Binding linear muffin-tin orbital method ) is a method to calculate band structure and compiled f77 under Redhat 7.0 and 7.2 Linux.
  • Band structure,
  • Density of state (DOS)

• Wien97 is the LAPW Method to calculate Band structure and other properties in solid state physics. Ver. 10 can calculate the DOS, BAND, Optics, X-ray with spin polarization ( with the option of spin-orbit ). Recently updated to WIEN 2k.
  • Band structure,
  • Density of state (DOS),
  • Optical conductivity (diagonal, off diagonal )